Authors: Khadija, H; Khalifa, M; Alvarez-Galvan, MC; Ezzaouia, H

Eur. Phys. J.-Appl. Phys. vol: 93. page: 1286-0042.
Date: jun-21. 2021.
Doi: 10.1051/epjap/2021210016.

This work reports on correlation between structural and morphological properties of ZnTiO3/porous silicon (PS). The PS was elaborated by electrochemical anodization from the single- crystal p-type silicon wafer. Nanocrystalline ZnTiO3 thinfilms have been prepared on PS using sol-gels pin coating technique. The deposited films were annealed in air at 800 degrees C for 2h. The structural and morphological properties of the films were studied for different number of layers. X-ray diffraction spectra confirms that ZnTiO3 films were hexagonal phase and the crystallite size of ZnTiO3 films increased from 111 to 125nm when the number of layers increase from 4 to 8 layers. SEM image shows approximate semi-spherical particles with a little agglomeration for all samples. The morphologies changed and the average grain size changed and increases from 81nm to 131nm..