Presentation

Objective
To support the scientific research carried out either in or outside the Institute of Catalysis and Petroleum Chemistry (ICP) by means of Atomic Force Microscopy (AFM) and Scanning Tunneling Microscopy (STM). Research outside ICP includes the one carried out in other OPIs (Public Research Institutions), Universities and Companies.

Equipment and accessories
A high-resolution ‘Agilent 5500 Scanning Probe Microscope’ is offered. It is  isolated from external vibrations. It allows acquiring / registering images in contact or acoustic mode (AFM or ACAFM) for non conducting surfacesand scanning tunneling techniques for conducting samples.
It is a quite versatile instrument, as it has the accessories to carry out measurements under different conditions:

  • Surfaces exposed to air or immersed in a liquid solution
  • Under temperature   control (aprox. range:  -10 oCup to 200oC)
  • Undercontrolledatmosphere
  • AFM / STM combined with electrochemical studies

Furthermore, the software “PicoImage”, which allows advanced treatment of images and is compatible with the acquisition software “PicoView”, is also available.

Team

Before processing any application, we recommend to contact the staff members in charge, either the scientific advisor or the technician (MariselaVélez: marisela.velez@icp.csic.es, Tel. 915854802; and Victoria E. García: ve.garcia@csic.es, Tel. 91.5854762/4634, respectively).

Marisela Vélez
Marisela Vélez
Scientific Advisor
Victoria E. García
Victoria E. García
Technician

Services

Service Guidelines
Before applied for any AFM-STM service offered in ICP, it is stronglyrecommendedto read carefully the Service Guideline (Guía de servicio SPM)only available in Spanish). Its reading is mandatory if the service isdemandedfor the first time or if the user is not familiarized with the technique and/or the instrument.
Likewise, before processing any application, we recommend to contact the staff members in charge, either the scientific advisor or the technician (MariselaVélez: marisela.velez@icp.csic.es, Tel. 915854802; and Victoria E. García: ve.garcia@csic.es, Tel. 91.5854762/4634, respectively).
Users (either internal or external) are not allowed to handle the AFM-STM equipment. The technician or otherwise the scientific advisor are required to be y present during all the measurement process.

Applications
Once the applicant has read the Service Guidelines carefully andcontactedthe staff in charge of this service, it is necessary to download the application form (Solicitud_SPM.doc), only available in Spanish). It must be filled in and sent to the email address (marisela.velez@icp.csic.es). Later, the technician will contact the applicant / user in order to set a date and time for the experiments.

Kind of measurements
The offered experimental measurements can be classified as follows:

1. Conventional: AFM and/or STM measurements of liquid or solid samples, with no control of temperature or atmosphere.
2. Advanced. They include all kind of measurements requiring the use of controlled atmosphere, temperature and/or electrochemical cells.

Image treatment is also offered as additional service, as well as support for interpretation of results.
A conventional laboratory of sample preparation is also available. It is equipped with anultrasonic equipment, micropipettes,frequently used solvents (ethanol, acetone, etc.) and differentsupports: f hydrophobic (graphite), hydrophilic (mica) and conducting(graphite and gold).

Fares

€ Cost Unit CSIC H2020 CSIC OPI/AGE/Universities Others
Scanning Probe Microscpy (AFM and STM) €/hour

83,34

64,90

18,44

83,34

22,18

26,02

87,51 95,84
Atomic Force Microscopy (in liquid) €/hour

95,44

64,90

30,54

95,44

31,98

37,51

100,21 109,76
Atomic Force Microscopy (variable temperature) €/hour

104,36

64,90

39,46

104,36

37,13

43,55

109,58 120,01
Atomic Force Microscopy (electrochemical cell) €/hour

187,16

64,90

122,26

187,16

104,18

122,20

196,52 215,23

Total cost identified for the variant

“Eligible” Quantity H2020

Quantity “Not Eligible” H2020

Total cost identified for the variant

Marginal Cost

Marginal Cost+Indirect Costs