Presentation

The analysis of solid surfaces, oriented to scientific and research work, is fundamental in the study of their mechanical, physical and chemical properties. Photoelectronic spectroscopic techniques of surface analysis are based on the study of the energy of the electrons emitted by the solid when it is irradiated with X-ray photons (X-ray photoelectronic spectroscopy – XPS -) or ultraviolet ones (ultraviolet photoelectronic spectroscopy – UPS -). These techniques allow the identification of the elements and provide detailed information on the state of the chemical bonds and the concentration of the surface atoms.

Team

Staff
Dr. Miguel Antonio Peña Jiménez (Researcher in charge)
Dr. José Carlos Conesa Cegarra (Researcher in charge)
Dr. Cristina García Diego (Technical Director and Analyst) – Contact person

An electron spectroscopy system SPECS GmbH with UHV system (pressure approx. 10-10 mbar), with energy analyzer PHOIBOS 150 9MCD, monochromatic (with double anode Al/Ag) and non-monochromatic (with double anode Al/Mg) X-ray sources, electron source for charge compensation, UV photon source, ion source and sample pretreatment chamber (HPC) is available.

Quality Policy

This Service has a Quality Management System certified by AENOR under the ISO 9001 standard (ER-0305/2008-2020).
In its Quality Policy, the Photoelectronic Spectroscopy Service assumes the commitment to satisfy the requirements of this standard, as a means to achieve and maintain a high degree of quality in all the analyses performed.
Commitment letter

 Equipment

Photoelectron spectroscopy system

Analysis chamber with UHV system (pressure approx. 10-10 mbar)
SPECS PHOIBOS 150 9MCD Power Analyzer with Multi-Channeltron Detector (9 channels) for XPS and UPS
Non-monochromatic X-ray source, with double Al/Mg anode
Monochromatic X-ray source, with double Al/Ag anode
Electron source, for load compensation
Ultraviolet photon source, for UPS analysis
Ion source, for depth profiles

Sample introduction chamber

Reaction chamber (HPC)

Service

The Photoelectronic Spectroscopy Service provides analytical support to the research staff of the Catalysis and Petrochemical Institute and other CSIC centres, as well as to universities, research centres and private companies or organisations that request it.

Analysis request
To request the analysis, the XPS and/or UPS Request must be completed and delivered with the samples to the Technical Director of the Service.
In case pressure and temperature pre-treatment and subsequent analysis is desired, please fill out only the HPC+Analysis Request form.

Operation Guide
Before submitting the Application, please read carefully the Guide to the Operation of the Photoelectronic Spectroscopy Service

Contact information
Technical Director and Analyst of the Photoelectronic Spectroscopy Service:
Dr. Cristina García Diego
Location:
Photoelectronic Spectroscopy Service – Laboratory S11
Catalysis and Petrochemical Institute (CSIC)
C/ Marie Curie 2
28049 Cantoblanco, Madrid, Spain

Email: xps@icp.csic.es
Telephone: 915854634
Fax: 915854760

Maximum delivery time of results per Application Form

XPS Analysis 4 months
Ion pickling analysis + XPS 6 months
HPC + XPS analysis 6 months
UPS Analysis 4 months

Notes:
Current deadlines for requests for analysis after 12/11/2019.
Deadlines are in calendar days.
The deadlines are conditioned to having deposited the samples to be analyzed at the Photoelectronic Spectroscopy Service.
In order not to increase waiting times for other users, for those principal investigators who submit more than 1 Application Form every 15 days for any of the techniques offered by the Service, the delivery time for results will be doubled.
When special analysis conditions are requested, as reflected in the Annexes to the Application Forms, the delivery time for the results will depend on the demand for the Service at any given time, with a maximum period of 6 months.
These periods may be modified due to vacation periods, leaves of absence, lack of availability of personnel, etc.

Rates

CSIC Institutes and Centres 33.88 €/hour (H2020)
8.49 €/hour (other projects)
Public Administrations, Public Research Bodies,
ICTS, Foundations and Universities
66.26 €/hour
Rest of Entities 100.97 €/hour
CSIC Institutes and Centres 33.88/hour (H2020)
10.79/hour (other projects)
Public Administrations, Public Research Bodies,
ICTS, Foundations and Universities
68.73/hour
Rest of Entities 104.72 euros/hour
CSIC Institutes and Centres 33.88/hour (H2020)
10.79/hour (other projects)
Public Administrations, Public Research Bodies,
ICTS, Foundations and Universities
68.73/hour
Rest of Entities 104.72 euros/hour
CSIC Institutes and Centres 67.77/sample (H2020)
22.98/ sample (other projects)
Public Administrations, Public Research Bodies,
ICTS, Foundations and Universities
139.08 euro/sample
Rest of Entities 211.93 euros/sample

Notes:
Current rates for analysis requests after 17/01/2020.
In the case of hourly pricing, only the full hours (rounded up) of pre-processing carried out or spectrum analysis delivered to the user will be counted.
Special rates will be applied with those entities with which there are agreements or arrangements.
Where applicable, VAT will be applied.
These rates do not include the interpretation of results.
Depth Profile results will be delivered by pickling time. In the case that it is desired by unit of depth and the Photoelectronic Spectroscopy Service does not have the data for the conditions of analysis that the applicant wishes, the applicant must provide the reference material, as well as will be economically responsible for the depth profile of the same.

Other information

In order to help XPS users, you can download a class on XPS given by Miguel Antonio Peña Jiménez in the context of different courses on characterization of inorganic materials. The presentation describes the basic fundamentals of the technique and gives the basis for the manipulation and interpretation of spectra.

Click here to download the Oberon MS Excel 97 spreadsheet, which allows you to determine all the XPS and Auger lines that a given sample can present, from its elemental atomic composition. When you open the file, you must choose the option “Enable Macros”. This is a trial version, so user suggestions are welcome.

XPS databases:

Lasurface CNRS-VG Scientific

XPS, Auger and UPS database developed by CNRS with assistance from VG Scientific.

NIST XPS Database

NIST (National Institute of Standards and Technology) XPS database.

Associations:

UK Surface Analysis Forum

Databases, Surface Science Techniques, Courses, News, Magazines, Conferences, Research Groups and links of interest.