Our Goal
Our TEM service is equipped with a TEM/STEM (JEOL 2100F) operating at 200KV with a Field Emission Gun, and a point resolution of 0.19 nm. EDX detector (X-Max80 by Oxford Instruments) is coupled to the TEM, which allows the possibility of semi-quantitative chemical analysis. By using the STEM unit, Z-contrast images as well as the chemical characterization of areas of few nanometers can be done.
A sample preparation laboratory equipped with an ultrasound bath and basic lab material for powder samples is available.
Team
Contact person
laura.pascual@icp.csic.es
Services
We offer the services displayed below. In order to apply for the TEM service, it is necessary to download the application form, fill and send it to the following e-mail address (laura.pascual@icp.csic.es).
Our staff will contact you as soon as possible to fix a date and will also resolve any question you might have.
CTEM
Conventional TEM for morphology analysis
HRTEM
High resolution imaging for microestructural studies
STEM-HAADF
Z-contrast images
Rates
Rates are updated and can be found at the Catálogo de Prestaciones of the CSIC
| INSTITUTION | With technician | Semi-autonomous |
|---|---|---|
| CSIC (For H2020 proyects) | 41.65 (euros/h) | 32.31 (euros/h) |
| CSIC (For other proyects) | 35.08 (euros/h) | 22.99 (euros/h) |
| UNIVERSITIES/OPIS | 117.85 (euros/h) | 92.36 (euros/h) |
| COMPANIES | 129.08 (euros/h) | 101.15 (euros/h) |
These rates are for external users. Discounts to ICP and other organizations at the Campus UAM are applied. For more information please contact with the Technical Director (laura.pascual@icp.csic.es)